Automatic Configuration Generation for FPGA Interconnect Testing

V
VTS
2003
21st IEEE VLSI Test Symposium
Abstract - Automatic Configuration Generation for FPGA Interconnect Testing

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	Similar Articles Articles by Mehdi Baradaran Tahoori Articles by Subhasish Mitra

21st IEEE VLSI Test Symposium

Napa Valley, California

April 27-May 01

ISBN: 0-7695-1924-5

	ASCII Text	x
	Mehdi Baradaran Tahoori, Subhasish Mitra, "Automatic Configuration Generation for FPGA Interconnect Testing," VLSI Test Symposium, IEEE, pp. 134, 21st IEEE VLSI Test Symposium, 2003.

	BibTex	x
	@article{ 10.1109/VTEST.2003.1197644, author = {Mehdi Baradaran Tahoori and Subhasish Mitra}, title = {Automatic Configuration Generation for FPGA Interconnect Testing}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2003}, issn = {1093-0167}, pages = {134}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.2003.1197644}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Automatic Configuration Generation for FPGA Interconnect Testing SN - 1093-0167 SP EP A1 - Mehdi Baradaran Tahoori, A1 - Subhasish Mitra, PY - 2003 KW - null VL - 0 JA - VLSI Test Symposium, IEEE ER -

Mehdi Baradaran Tahoori, Stanford University, CA

Subhasish Mitra, Intel Corporation

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.2003.1197644

We present a new automatic test configuration generation technique for manufacturing testing of interconnect network of SRAM-based FPGA architectures. The technique guarantees detection of open and bridging faults in all wiring channels and programmable switches in the interconnects. Only 8 test configurations are required to achieve 100% coverage of stuck-open, stuck-closed, open and bridging faults in the interconnects of Xilinx Virtex FPGAs.

Citation:

Mehdi Baradaran Tahoori, Subhasish Mitra, "Automatic Configuration Generation for FPGA Interconnect Testing," vts, pp.134, 21st IEEE VLSI Test Symposium, 2003

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