8.4 Undetectable Fault Removal of Sequential Circuits Based on Unreachable States

V
VTS
1998
16th IEEE VLSI Test Symposium
Abstract - 8.4 Undetectable Fault Removal of Sequential Circuits Based on Unreachable States

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16th IEEE VLSI Test Symposium

Monterey, California

April 26-April 30

ISBN: 0-8186-8436-4

	ASCII Text	x
	H. Yotsuyanagi, K. Kinoshita, "8.4 Undetectable Fault Removal of Sequential Circuits Based on Unreachable States," VLSI Test Symposium, IEEE, pp. 176, 16th IEEE VLSI Test Symposium, 1998.

	BibTex	x
	@article{ 10.1109/VTEST.1998.670866, author = {H. Yotsuyanagi and K. Kinoshita}, title = {8.4 Undetectable Fault Removal of Sequential Circuits Based on Unreachable States}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {1998}, issn = {1093-0167}, pages = {176}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1998.670866}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - 8.4 Undetectable Fault Removal of Sequential Circuits Based on Unreachable States SN - 1093-0167 SP EP A1 - H. Yotsuyanagi, A1 - K. Kinoshita, PY - 1998 VL - 0 JA - VLSI Test Symposium, IEEE ER -

H. Yotsuyanagi

K. Kinoshita

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.1998.670866

Citation:

H. Yotsuyanagi, K. Kinoshita, "8.4 Undetectable Fault Removal of Sequential Circuits Based on Unreachable States," vts, pp.176, 16th IEEE VLSI Test Symposium, 1998

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