X. Lin, I. Pomeranz, S.M. Reddy, "8.3 On Removing Redundant Faults in Synchronous Sequential Circuits," VLSI Test Symposium, IEEE, pp. 168, 16th IEEE VLSI Test Symposium, 1998.

@article{ 10.1109/VTEST.1998.670865,
author = {X. Lin and I. Pomeranz and S.M. Reddy},
title = {8.3 On Removing Redundant Faults in Synchronous Sequential Circuits},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {1998},
issn = {1093-0167},
pages = {168},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1998.670865},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - VLSI Test Symposium, IEEE
TI - 8.3 On Removing Redundant Faults in Synchronous Sequential Circuits
SN - 1093-0167
SP
EP
A1 - X. Lin,
A1 - I. Pomeranz,
A1 - S.M. Reddy,
PY - 1998
VL - 0
JA - VLSI Test Symposium, IEEE
ER -