M. Psarakis, D. Gizopoulos, A. Paschalis, Y. Zorian, "8.1 Robustly Testable Array Multipliers under Realistic Sequential Cell Fault Model," VLSI Test Symposium, IEEE, pp. 152, 16th IEEE VLSI Test Symposium, 1998.

@article{ 10.1109/VTEST.1998.670863,
author = {M. Psarakis and D. Gizopoulos and A. Paschalis and Y. Zorian},
title = {8.1 Robustly Testable Array Multipliers under Realistic Sequential Cell Fault Model},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {1998},
issn = {1093-0167},
pages = {152},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1998.670863},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - VLSI Test Symposium, IEEE
TI - 8.1 Robustly Testable Array Multipliers under Realistic Sequential Cell Fault Model
SN - 1093-0167
SP
EP
A1 - M. Psarakis,
A1 - D. Gizopoulos,
A1 - A. Paschalis,
A1 - Y. Zorian,
PY - 1998
VL - 0
JA - VLSI Test Symposium, IEEE
ER -