J.T.-Y. Chang, C.-W. Tseng, Y.-C. Chu, S. Wattal, M. Purtell, E.J. McCluskey, "6.3 Experimental Results for IDDQ and VLV Testing," VLSI Test Symposium, IEEE, pp. 118, 16th IEEE VLSI Test Symposium, 1998.

@article{ 10.1109/VTEST.1998.670858,
author = {J.T.-Y. Chang and C.-W. Tseng and Y.-C. Chu and S. Wattal and M. Purtell and E.J. McCluskey},
title = {6.3 Experimental Results for IDDQ and VLV Testing},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {1998},
issn = {1093-0167},
pages = {118},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1998.670858},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - VLSI Test Symposium, IEEE
TI - 6.3 Experimental Results for IDDQ and VLV Testing
SN - 1093-0167
SP
EP
A1 - J.T.-Y. Chang,
A1 - C.-W. Tseng,
A1 - Y.-C. Chu,
A1 - S. Wattal,
A1 - M. Purtell,
A1 - E.J. McCluskey,
PY - 1998
VL - 0
JA - VLSI Test Symposium, IEEE
ER -