loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
16th IEEE VLSI Test Symposium
4.1 COMPACT: A Hybrid Method for Compressing Test Data
Monterey, California
April 26-April 30
ISBN: 0-8186-8436-4
ASCII Text
x 
 
M. Ishida, D.S. Ha, T. Yamaguchi, "4.1 COMPACT: A Hybrid Method for Compressing Test Data," VLSI Test Symposium, IEEE, pp. 62, 16th IEEE VLSI Test Symposium, 1998.
 
 
BibTex
x
 
@article{ 10.1109/VTEST.1998.670850,
author = {M. Ishida and D.S. Ha and T. Yamaguchi},
title = {4.1 COMPACT: A Hybrid Method for Compressing Test Data},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {1998},
issn = {1093-0167},
pages = {62},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1998.670850},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - 4.1 COMPACT: A Hybrid Method for Compressing Test Data
SN - 1093-0167
SP
EP
A1 - M. Ishida,
A1 - D.S. Ha,
A1 - T. Yamaguchi,
PY - 1998
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
Citation:
M. Ishida, D.S. Ha, T. Yamaguchi, "4.1 COMPACT: A Hybrid Method for Compressing Test Data," vts, pp.62, 16th IEEE VLSI Test Symposium, 1998
Usage of this product signifies your acceptance of the Terms of Use.