J. Zhao, F.J. Meyer, F. Lombardi, "3.1 Fault Detection and Diagnosis of Interconnects of Random Access Memories," VLSI Test Symposium, IEEE, pp. 42, 16th IEEE VLSI Test Symposium, 1998.

@article{ 10.1109/VTEST.1998.670847,
author = {J. Zhao and F.J. Meyer and F. Lombardi},
title = {3.1 Fault Detection and Diagnosis of Interconnects of Random Access Memories},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {1998},
issn = {1093-0167},
pages = {42},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1998.670847},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - VLSI Test Symposium, IEEE
TI - 3.1 Fault Detection and Diagnosis of Interconnects of Random Access Memories
SN - 1093-0167
SP
EP
A1 - J. Zhao,
A1 - F.J. Meyer,
A1 - F. Lombardi,
PY - 1998
VL - 0
JA - VLSI Test Symposium, IEEE
ER -