K.T. Lee, C. Nordquist, J.A. Abraham, "2.3 Automatic Test Pattern Generation for Crosstalk Glitches in Digital Circuits," VLSI Test Symposium, IEEE, pp. 34, 16th IEEE VLSI Test Symposium, 1998.

@article{ 10.1109/VTEST.1998.670846,
author = {K.T. Lee and C. Nordquist and J.A. Abraham},
title = {2.3 Automatic Test Pattern Generation for Crosstalk Glitches in Digital Circuits},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {1998},
issn = {1093-0167},
pages = {34},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1998.670846},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - VLSI Test Symposium, IEEE
TI - 2.3 Automatic Test Pattern Generation for Crosstalk Glitches in Digital Circuits
SN - 1093-0167
SP
EP
A1 - K.T. Lee,
A1 - C. Nordquist,
A1 - J.A. Abraham,
PY - 1998
VL - 0
JA - VLSI Test Symposium, IEEE
ER -