Highly testable and compact single output comparator

V
VTS
1997
15th IEEE VLSI Test Symposium (VTS'97)
Abstract - Highly testable and compact single output comparator

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	Similar Articles Articles by C. Metra Articles by M. Favalli Articles by B. Ricco

15th IEEE VLSI Test Symposium (VTS'97)

Monterey, California

April 27-May 01

ISBN: 0-8186-7810-0

	ASCII Text	x
	C. Metra, M. Favalli, B. Ricco, "Highly testable and compact single output comparator," VLSI Test Symposium, IEEE, pp. 210, 15th IEEE VLSI Test Symposium (VTS'97), 1997.

	BibTex	x
	@article{ 10.1109/VTEST.1997.600272, author = {C. Metra and M. Favalli and B. Ricco}, title = {Highly testable and compact single output comparator}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {1997}, isbn = {0-8186-7810-0}, pages = {210}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1997.600272}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Highly testable and compact single output comparator SN - 0-8186-7810-0 SP EP A1 - C. Metra, A1 - M. Favalli, A1 - B. Ricco, PY - 1997 KW - comparators (circuits); single output comparator; self-checking n-input comparator; n-variable two-rail checker; equality checker; totally-self-checking; strongly code-disjoint; input code words; fault detection; embedded comparators; VLSI VL - 0 JA - VLSI Test Symposium, IEEE ER -

C. Metra, Dipt. di Elettronica Inf. e Sistemistica, Bologna Univ., Italy

M. Favalli, Dipt. di Elettronica Inf. e Sistemistica, Bologna Univ., Italy

B. Ricco, Dipt. di Elettronica Inf. e Sistemistica, Bologna Univ., Italy

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.1997.600272

In this paper a single output self-checking n-input comparator is presented. The proposed circuit, which can be used as n-variable two-rail checker or as equality checker features a compact structure, is Totally-Self-Checking or Strongly Code-Disjoint with respect to a wide set of realistic faults, and requires a limited set of input code words for fault detection (thus it can be used to implement also embedded comparators).

Index Terms:

comparators (circuits); single output comparator; self-checking n-input comparator; n-variable two-rail checker; equality checker; totally-self-checking; strongly code-disjoint; input code words; fault detection; embedded comparators; VLSI

Citation:

C. Metra, M. Favalli, B. Ricco, "Highly testable and compact single output comparator," vts, pp.210, 15th IEEE VLSI Test Symposium (VTS'97), 1997

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