A novel probabilistic approach for IC diagnosis based on differential quiescent current signatures

V
VTS
1997
15th IEEE VLSI Test Symposium (VTS'97)
Abstract - A novel probabilistic approach for IC diagnosis based on differential quiescent current signatures

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15th IEEE VLSI Test Symposium (VTS'97)

Monterey, California

April 27-May 01

ISBN: 0-8186-7810-0

	ASCII Text	x
	C. Thibeault, "A novel probabilistic approach for IC diagnosis based on differential quiescent current signatures," VLSI Test Symposium, IEEE, pp. 80, 15th IEEE VLSI Test Symposium (VTS'97), 1997.

	BibTex	x
	@article{ 10.1109/VTEST.1997.599445, author = {C. Thibeault}, title = {A novel probabilistic approach for IC diagnosis based on differential quiescent current signatures}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {1997}, isbn = {0-8186-7810-0}, pages = {80}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1997.599445}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - A novel probabilistic approach for IC diagnosis based on differential quiescent current signatures SN - 0-8186-7810-0 SP EP A1 - C. Thibeault, PY - 1997 KW - maximum likelihood estimation; IC diagnosis; IDDQ testing; probabilistic differential quiescent current signature; maximum likelihood estimation; subthreshold leakage current; noise source; embedded logic; robustness VL - 0 JA - VLSI Test Symposium, IEEE ER -

C. Thibeault, Dept. of Electr. Eng., Ecole de Technol. Superieure, Montreal, Que., Canada

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.1997.599445

In this paper, we propose a novel IC diagnosis approach, based on probabilistic differential quiescent current (I/sub DDQ/) signatures. Unlike the previous diagnosis approaches using current, this approach, using the maximum likelihood estimation, provides a solid framework allowing to quantify its robustness with respect to current measurement variations. The differential nature of the signatures allows to treat subthreshold leakage currents as a noise source. Results are provided showing the robustness of the approach. The applicability of the approach on embedded logic is also briefly discussed.

Index Terms:

maximum likelihood estimation; IC diagnosis; IDDQ testing; probabilistic differential quiescent current signature; maximum likelihood estimation; subthreshold leakage current; noise source; embedded logic; robustness

Citation:

C. Thibeault, "A novel probabilistic approach for IC diagnosis based on differential quiescent current signatures," vts, pp.80, 15th IEEE VLSI Test Symposium (VTS'97), 1997

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