Using fault sampling to compute I/sub DDQ/ diagnostic test sets

V
VTS
1997
15th IEEE VLSI Test Symposium (VTS'97)
Abstract - Using fault sampling to compute I/sub DDQ/ diagnostic test sets

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	Similar Articles Articles by Yiming Gong Articles by S. Chakravarty

15th IEEE VLSI Test Symposium (VTS'97)

Monterey, California

April 27-May 01

ISBN: 0-8186-7810-0

	ASCII Text	x
	Yiming Gong, S. Chakravarty, "Using fault sampling to compute I/sub DDQ/ diagnostic test sets," VLSI Test Symposium, IEEE, pp. 74, 15th IEEE VLSI Test Symposium (VTS'97), 1997.

	BibTex	x
	@article{ 10.1109/VTEST.1997.599444, author = {Yiming Gong and S. Chakravarty}, title = {Using fault sampling to compute I/sub DDQ/ diagnostic test sets}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {1997}, isbn = {0-8186-7810-0}, pages = {74}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1997.599444}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Using fault sampling to compute I/sub DDQ/ diagnostic test sets SN - 0-8186-7810-0 SP EP A1 - Yiming Gong, A1 - S. Chakravarty, PY - 1997 KW - combinational circuits; fault sampling; IDDQ diagnostic test set generation; bridging faults; combinational circuit VL - 0 JA - VLSI Test Symposium, IEEE ER -

Yiming Gong, Quickturn Syst. Inc., Mountain View, CA, USA

S. Chakravarty, Quickturn Syst. Inc., Mountain View, CA, USA

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.1997.599444

A diagnostic test generation system for computing I/sub DQQ/ diagnostic test sets for bridging faults in combinational circuits is presented. The system uses fault sampling. Experimental results presented show that fault sampling is a very effective method for computing diagnostic test sets, especially when the number of target faults is very large.

Index Terms:

combinational circuits; fault sampling; IDDQ diagnostic test set generation; bridging faults; combinational circuit

Citation:

Yiming Gong, S. Chakravarty, "Using fault sampling to compute I/sub DDQ/ diagnostic test sets," vts, pp.74, 15th IEEE VLSI Test Symposium (VTS'97), 1997

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