A solution for the on-line test of analog ladder filters

V
VTS
1995
13th IEEE VLSI Test Symposium (VTS'95)
Abstract - A solution for the on-line test of analog ladder filters

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13th IEEE VLSI Test Symposium (VTS'95)

Princeton, New Jersey

April 30-May 03

ISBN: 0-8186-7000-2

	ASCII Text	x
	D. Vazquez, A. Rueda, J.L. Huertas, "A solution for the on-line test of analog ladder filters," VLSI Test Symposium, IEEE, pp. 0048, 13th IEEE VLSI Test Symposium (VTS'95), 1995.

	BibTex	x
	@article{ 10.1109/VTEST.1995.512616, author = {D. Vazquez and A. Rueda and J.L. Huertas}, title = {A solution for the on-line test of analog ladder filters}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {1995}, isbn = {0-8186-7000-2}, pages = {0048}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1995.512616}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - A solution for the on-line test of analog ladder filters SN - 0-8186-7000-2 SP EP A1 - D. Vazquez, A1 - A. Rueda, A1 - J.L. Huertas, PY - 1995 KW - analogue integrated circuits; ladder filters; active filters; circuit stability; design for testability; integrated circuit testing; analog ladder filters; stability problems; design for test methodology; on-line testing; solution feasibility; analogue ICs; active filters VL - 0 JA - VLSI Test Symposium, IEEE ER -

D. Vazquez, Dpto. de Diseno Analogico, Univ. de Sevilla, Spain

A. Rueda, Dpto. de Diseno Analogico, Univ. de Sevilla, Spain

J.L. Huertas, Dpto. de Diseno Analogico, Univ. de Sevilla, Spain

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.1995.512616

Abstract: In this paper we study stability problems associated with the previously developed design for test (DFT) methodology applied to ladder filters. A solution based on simple modification of the basic DFT strategy is proposed which allows on-line testing of ladder filters. A filter example demonstrates the feasibility of the solution.

Index Terms:

analogue integrated circuits; ladder filters; active filters; circuit stability; design for testability; integrated circuit testing; analog ladder filters; stability problems; design for test methodology; on-line testing; solution feasibility; analogue ICs; active filters

Citation:

D. Vazquez, A. Rueda, J.L. Huertas, "A solution for the on-line test of analog ladder filters," vts, pp.0048, 13th IEEE VLSI Test Symposium (VTS'95), 1995

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