20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07) Bangalore, India January 06-January 10 ISBN: 0-7695-2762-0
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VLSID.2007.51
As we move to 45nm and beyond, our ability to manage the need for increased integration together with the drive for higher system performance and lower power presents many challenges to technology and design. It has become no longer possible to consider technology advancement without considering the overall optimization of the transistor and circuit design for full entitlement together with the cost of the chip. This paper looks at the key challenges and technology discontinuities that we face as we move into the nano CMOS regime, and some of the approaches being developed to address them.
Citation:
Ajith Amerasekera, "Concurrent Optimization of Technology and Design for Nano CMOS," vlsid, pp.27, 20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07), 2007 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||