David Abercrombie, Bernd Koenemann, Nagesh Tamarapalli, Srikanth Venkataraman, "DFM, DFT, Silicon Debug and Diagnosis — The Loop to Ensure Product Yield," VLSI Design, International Conference on, pp. 14, 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06), 2006.

@article{ 10.1109/VLSID.2006.73,
author = {David Abercrombie and Bernd Koenemann and Nagesh Tamarapalli and Srikanth Venkataraman},
title = {DFM, DFT, Silicon Debug and Diagnosis — The Loop to Ensure Product Yield},
journal ={VLSI Design, International Conference on},
volume = {0},
year = {2006},
issn = {1063-9667},
pages = {14},
doi = {http://doi.ieeecomputersociety.org/10.1109/VLSID.2006.73},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - VLSI Design, International Conference on
TI - DFM, DFT, Silicon Debug and Diagnosis — The Loop to Ensure Product Yield
SN - 1063-9667
SP
EP
A1 - David Abercrombie,
A1 - Bernd Koenemann,
A1 - Nagesh Tamarapalli,
A1 - Srikanth Venkataraman,
PY - 2006
KW - null
VL - 0
JA - VLSI Design, International Conference on
ER -