"Call for Participation: 10th IEEE VLSI Design & Test Symposium," VLSI Design, International Conference on, pp. xli, 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06), 2006.

@article{ 10.1109/VLSID.2006.55,
author = {},
title = {Call for Participation: 10th IEEE VLSI Design & Test Symposium},
journal ={VLSI Design, International Conference on},
volume = {0},
year = {2006},
issn = {1063-9667},
pages = {xli},
doi = {http://doi.ieeecomputersociety.org/10.1109/VLSID.2006.55},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - VLSI Design, International Conference on
TI - Call for Participation: 10th IEEE VLSI Design & Test Symposium
SN - 1063-9667
SP
EP
PY - 2006
KW - null
VL - 0
JA - VLSI Design, International Conference on
ER -