19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06)
An On-Chip Diagnosis Methodology for Embedded Cores with Replaceable Modules
Hyderabad, India
January 03-January 07
ISBN: 0-7695-2502-4
DOI Bookmark:
http://doi.ieeecomputersociety.org/10.1109/VLSID.2006.45
We propose a design for test and diagnosis architecture that simplifies the process of identifying failures within a failing sub-module, without explicitly identifying the faults responsible for that failure. The extra hardware eliminates the post-processing step needed to process the failure logs from the tester and automatically determines the sub-modules inside a core that must be replaced. The proposed methodology reduces the turnaround time for locating a failing module or sub-module and also facilitates testing and diagnosis at the same time. Experimental results are presented using industrial test-cases to validate the effectiveness of the proposed method.
Citation:
Ramesh C. Tekumalla, "An On-Chip Diagnosis Methodology for Embedded Cores with Replaceable Modules," vlsid, pp.824-827, 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06), 2006
Usage of this product signifies your acceptance of the
Terms of Use.
|
|||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||