loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06)
Accurate Substrate Noise Analysis Based on Library Module Characterization
Hyderabad, India
January 03-January 07
ISBN: 0-7695-2502-4
Subodh M. Reddy, Fujitsu Laboratories of America, Inc.
Rajeev Murgai, Fujitsu Laboratories of America, Inc.
As the design complexity increases, a detailed SPICE model cannot be used to study substrate noise injected by the digital logic into the analog circuit in a mixed-signal system. Hence a reduced yet accurate model is needed. Previous work [7] shows that the current drawn by the digital circuit from the power supply has a big impact on the substrate noise and therefore must be modeled accurately in the reduced model. In this paper, we propose an accurate current modeling technique based on pre-characterizing library modules for the current drawn from the power supply as a function of time, load capacitance, input transitions and slews. This technique is then embedded in both pattern-dependent (PDM) [3, 15] and pattern-independent (PIM) [7] substrate noise analysis methodologies. Results on several gate-level benchmarks show that the proposed scheme is, on average, within 4.5% of the detailed BSIM3-based model for PDM and within 12% for PIM. In contrast, the previously proposed scheme of [7] has an average discrepancy of 176% with the detailed model for PIM.
Citation:
Subodh M. Reddy, Rajeev Murgai, "Accurate Substrate Noise Analysis Based on Library Module Characterization," vlsid, pp.355-362, 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06), 2006
Usage of this product signifies your acceptance of the Terms of Use.