19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06) Accurate Substrate Noise Analysis Based on Library Module Characterization Hyderabad, India January 03-January 07 ISBN: 0-7695-2502-4
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VLSID.2006.30
As the design complexity increases, a detailed SPICE model cannot be used to study substrate noise injected by the digital logic into the analog circuit in a mixed-signal system. Hence a reduced yet accurate model is needed. Previous work [7] shows that the current drawn by the digital circuit from the power supply has a big impact on the substrate noise and therefore must be modeled accurately in the reduced model. In this paper, we propose an accurate current modeling technique based on pre-characterizing library modules for the current drawn from the power supply as a function of time, load capacitance, input transitions and slews. This technique is then embedded in both pattern-dependent (PDM) [3, 15] and pattern-independent (PIM) [7] substrate noise analysis methodologies. Results on several gate-level benchmarks show that the proposed scheme is, on average, within 4.5% of the detailed BSIM3-based model for PDM and within 12% for PIM. In contrast, the previously proposed scheme of [7] has an average discrepancy of 176% with the detailed model for PIM.
Citation:
Subodh M. Reddy, Rajeev Murgai, "Accurate Substrate Noise Analysis Based on Library Module Characterization," vlsid, pp.355-362, 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06), 2006 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||