Using Level Restoring Method for Dual Supply Voltage

	This Article
	Subscribers, please Login Purchase article: $19 PDF IEEE Xplore Subscribers RSS feed
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by K. Sadeghi Articles by M. Emadi Articles by F. Farbiz

19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06)

Hyderabad, India

January 03-January 07

ISBN: 0-7695-2502-4

	ASCII Text	x
	K. Sadeghi, M. Emadi, F. Farbiz, "Using Level Restoring Method for Dual Supply Voltage," VLSI Design, International Conference on, pp. 601-605, 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06), 2006.

	BibTex	x
	@article{ 10.1109/VLSID.2006.165, author = {K. Sadeghi and M. Emadi and F. Farbiz}, title = {Using Level Restoring Method for Dual Supply Voltage}, journal ={VLSI Design, International Conference on}, volume = {0}, year = {2006}, issn = {1063-9667}, pages = {601-605}, doi = {http://doi.ieeecomputersociety.org/10.1109/VLSID.2006.165}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Design, International Conference on TI - Using Level Restoring Method for Dual Supply Voltage SN - 1063-9667 SP601 EP605 A1 - K. Sadeghi, A1 - M. Emadi, A1 - F. Farbiz, PY - 2006 KW - null VL - 0 JA - VLSI Design, International Conference on ER -

K. Sadeghi, Sharif University of Technology

M. Emadi, Sharif University of Technology

F. Farbiz, University of Illinois at Urbana Champion

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VLSID.2006.165

A new level converter for use in dual voltage SOI digital circuits is presented. This technique uses the idea of keeper transistors, and consumes less power compared to the traditional methods. The effects of load capacitance on the circuit are studied by extensive simulations.

Citation:

K. Sadeghi, M. Emadi, F. Farbiz, "Using Level Restoring Method for Dual Supply Voltage," vlsid, pp.601-605, 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06), 2006

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.