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19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06)
Reducing Design Verification Cycle Time through Testbench Redundancy
Hyderabad, India
January 03-January 07
ISBN: 0-7695-2502-4
Aman Kokrady, Texas Instruments
Theo J. Powell, Texas Instruments
S. Ramakrishnan, Emerging Memory Tech.
Design flows for modern-day System-on-Chip (SoC) designs focus on reducing the design cycle time, but not on design verification time. Nearly 70% of SoC design cycle time is consumed by design verification [10]. Most functional verification happens through simulation. This paper proposes a technique by which the simulation times of time consuming verification steps can be reduced. The proposed technique exploits the testbench redundancy during functional simulations to reduce simulation time. We demonstrate how the testbench redundancy can be exploited to gain valuable cycle time during memory BIST simulations.
Citation:
Aman Kokrady, Theo J. Powell, S. Ramakrishnan, "Reducing Design Verification Cycle Time through Testbench Redundancy," vlsid, pp.243-248, 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06), 2006
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