PIDISC: Pattern Independent Design Independent Seed Compression Technique

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	Similar Articles Articles by Kedarnath J. Balakrishnan Articles by Seongmoon Wang Articles by Srimat T. Chakradhar

19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06)

Hyderabad, India

January 03-January 07

ISBN: 0-7695-2502-4

	ASCII Text	x
	Kedarnath J. Balakrishnan, Seongmoon Wang, Srimat T. Chakradhar, "PIDISC: Pattern Independent Design Independent Seed Compression Technique," VLSI Design, International Conference on, pp. 811-817, 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06), 2006.

	BibTex	x
	@article{ 10.1109/VLSID.2006.135, author = {Kedarnath J. Balakrishnan and Seongmoon Wang and Srimat T. Chakradhar}, title = {PIDISC: Pattern Independent Design Independent Seed Compression Technique}, journal ={VLSI Design, International Conference on}, volume = {0}, year = {2006}, issn = {1063-9667}, pages = {811-817}, doi = {http://doi.ieeecomputersociety.org/10.1109/VLSID.2006.135}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Design, International Conference on TI - PIDISC: Pattern Independent Design Independent Seed Compression Technique SN - 1063-9667 SP811 EP817 A1 - Kedarnath J. Balakrishnan, A1 - Seongmoon Wang, A1 - Srimat T. Chakradhar, PY - 2006 KW - null VL - 0 JA - VLSI Design, International Conference on ER -

Kedarnath J. Balakrishnan, NEC Laboratories America

Seongmoon Wang, NEC Laboratories America

Srimat T. Chakradhar, NEC Laboratories America

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VLSID.2006.135

A novel scheme for compressing the seeds of a linear feedback shifter register (LFSR) is presented. Instead of storing the seeds of the LFSR in the tester, the scheme compresses the seeds and stores them in the tester. The compression scheme can be used with any variation of static LFSR reseeding. An important feature of the proposed scheme is that the decompressor is test pattern and design independent and can be implemented with very little area overhead. Experimental results show that seed compression can improve overall compression by a factor of 7x for large industrial circuits.

Citation:

Kedarnath J. Balakrishnan, Seongmoon Wang, Srimat T. Chakradhar, "PIDISC: Pattern Independent Design Independent Seed Compression Technique," vlsid, pp.811-817, 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06), 2006

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