New Procedures to Identify Redundant Stuck-At Faults and Removal of Redundant Logic

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19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06)

Hyderabad, India

January 03-January 07

ISBN: 0-7695-2502-4

	ASCII Text	x
	Gang Chen, Sudhakar Reddy, Irith Pomeranz, Janusz Rajski, "New Procedures to Identify Redundant Stuck-At Faults and Removal of Redundant Logic," VLSI Design, International Conference on, pp. 419-424, 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06), 2006.

	BibTex	x
	@article{ 10.1109/VLSID.2006.120, author = {Gang Chen and Sudhakar Reddy and Irith Pomeranz and Janusz Rajski}, title = {New Procedures to Identify Redundant Stuck-At Faults and Removal of Redundant Logic}, journal ={VLSI Design, International Conference on}, volume = {0}, year = {2006}, issn = {1063-9667}, pages = {419-424}, doi = {http://doi.ieeecomputersociety.org/10.1109/VLSID.2006.120}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Design, International Conference on TI - New Procedures to Identify Redundant Stuck-At Faults and Removal of Redundant Logic SN - 1063-9667 SP419 EP424 A1 - Gang Chen, A1 - Sudhakar Reddy, A1 - Irith Pomeranz, A1 - Janusz Rajski, PY - 2006 KW - null VL - 0 JA - VLSI Design, International Conference on ER -

Gang Chen, University of Iowa

Sudhakar Reddy, University of Iowa

Irith Pomeranz, Purdue University

Janusz Rajski, Mentor Graphics Corporation

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VLSID.2006.120

We present new procedures for identifying redundant stuck-at faults including multiple line stuck-at faults on the branches of fan-out stems. The methods proposed include new procedures to identify stuck-at faults that are simultaneously redundant thus allowing simultaneous removal of logic associated with several redundant faults. Experimental results on benchmark as well as industrial circuits are also presented to demonstrate the effectiveness of the proposed methods.

Citation:

Gang Chen, Sudhakar Reddy, Irith Pomeranz, Janusz Rajski, "New Procedures to Identify Redundant Stuck-At Faults and Removal of Redundant Logic," vlsid, pp.419-424, 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06), 2006

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