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21st International Conference on VLSI Design (VLSI Design 2008)
Dynamic Error Detection for Dependable Cache Coherency in Multicore Architectures
Hyderabad, India
January 04-January 08
ISBN: 0-7695-3083-4
In Chip Multiprocessor (CMP) systems the various effects of technology scaling make the on chip components more sus- ceptible to faults. Most of the earlier schemes that address fault tolerance issues in CMPs adopt redundant-thread tech- niques. These techniques are mostly effective, except that they fail to detect errors resulting from faults in hardware compo- nents on chip that commonly serve multiple cores. The cache coherence controller (CC) logic, which ensures consistency of data shared among multiple threads, is a vital common com- ponent in CMPs. A fault in CC logic of any of the processors may lead to errors in the data states in the entire CMP sys- tem. It is observed that up to 59.6% of the memory references cause a change in cache state for SPLASH-2 applications. We propose a novel scheme with a verification logic that can dy- namically detect errors in the CC logic of multiple cores in a CMP system. The entire verification logic is designed with a negligible area of 0.1372 sq.mm using a TSMC ? ? 4-metal layer process technology. Even at highly aggressive fault in- jection rates, the logic achieves an average error coverage of more than 95% (and almost 100% for some applications)1.
Citation:
Hui Wang, Sandeep Baldawa, Rama Sangireddy, "Dynamic Error Detection for Dependable Cache Coherency in Multicore Architectures," vlsid, pp.279-285, 21st International Conference on VLSI Design (VLSI Design 2008), 2008
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