On Common-Mode Skewed-Load and Broadside Tests

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21st International Conference on VLSI Design (VLSI Design 2008)

Hyderabad, India

January 04-January 08

ISBN: 0-7695-3083-4

	ASCII Text	x
	Irith Pomeranz, Sudhakar M. Reddy, Sandip Kundu, "On Common-Mode Skewed-Load and Broadside Tests," VLSI Design, International Conference on, pp. 151-156, 21st International Conference on VLSI Design (VLSI Design 2008), 2008.

	BibTex	x
	@article{ 10.1109/VLSI.2008.16, author = {Irith Pomeranz and Sudhakar M. Reddy and Sandip Kundu}, title = {On Common-Mode Skewed-Load and Broadside Tests}, journal ={VLSI Design, International Conference on}, volume = {0}, year = {2008}, issn = {1063-9667}, pages = {151-156}, doi = {http://doi.ieeecomputersociety.org/10.1109/VLSI.2008.16}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Design, International Conference on TI - On Common-Mode Skewed-Load and Broadside Tests SN - 1063-9667 SP151 EP156 A1 - Irith Pomeranz, A1 - Sudhakar M. Reddy, A1 - Sandip Kundu, PY - 2008 VL - 0 JA - VLSI Design, International Conference on ER -

Irith Pomeranz

Sudhakar M. Reddy

Sandip Kundu

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VLSI.2008.16

Two-pattern tests for delay faults in standard scan circuits can be of one of two types: skewed-load or broad- side. Each type of tests creates different conditions during test application due to the different way in which scan mode and functional mode are interleaved. Therefore, tests that are applicable both as skewed-load tests and as broadside tests are useful for comparing the two types of tests with respect to properties such as defect coverage or overtesting. In this work we investigate the possibility of generating tests that are applicable under both test appli- cation schemes. We refer to two-pattern tests that are applicable as both skewed-load and broadside tests as common -mode tests. We show that most benchmark cir- cuits have sufficient numbers of common-mode tests to make them an interesting class of tests. Moreover, we show that the use of multiple scan chains increases the number of common-mode tests.

Citation:

Irith Pomeranz, Sudhakar M. Reddy, Sandip Kundu, "On Common-Mode Skewed-Load and Broadside Tests," vlsid, pp.151-156, 21st International Conference on VLSI Design (VLSI Design 2008), 2008

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