An NoC Test Strategy Based on Flooding with Power, Test Time and Coverage Considerations

	This Article
	Subscribers, please Login Purchase article: $19 PDF IEEE Xplore Subscribers RSS feed
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan/Endnote
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by Mahshid Sedghi Articles by Elnaz Koopahi Articles by Armin Alaghi Articles by Mahmood Fathy Articles by Zainalabedin Navabi

21st International Conference on VLSI Design (VLSI Design 2008)

Hyderabad, India

January 04-January 08

ISBN: 0-7695-3083-4

	ASCII Text	x
	Mahshid Sedghi, Elnaz Koopahi, Armin Alaghi, Mahmood Fathy, Zainalabedin Navabi, "An NoC Test Strategy Based on Flooding with Power, Test Time and Coverage Considerations," VLSI Design, International Conference on, pp. 409-414, 21st International Conference on VLSI Design (VLSI Design 2008), 2008.

	BibTex	x
	@article{ 10.1109/VLSI.2008.111, author = {Mahshid Sedghi and Elnaz Koopahi and Armin Alaghi and Mahmood Fathy and Zainalabedin Navabi}, title = {An NoC Test Strategy Based on Flooding with Power, Test Time and Coverage Considerations}, journal ={VLSI Design, International Conference on}, volume = {0}, year = {2008}, issn = {1063-9667}, pages = {409-414}, doi = {http://doi.ieeecomputersociety.org/10.1109/VLSI.2008.111}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Design, International Conference on TI - An NoC Test Strategy Based on Flooding with Power, Test Time and Coverage Considerations SN - 1063-9667 SP409 EP414 A1 - Mahshid Sedghi, A1 - Elnaz Koopahi, A1 - Armin Alaghi, A1 - Mahmood Fathy, A1 - Zainalabedin Navabi, PY - 2008 VL - 0 JA - VLSI Design, International Conference on ER -

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VLSI.2008.111

A test strategy for testing NoC switches based on flooding is presented in this paper. This test strategy tests all switch ports and network routes, while it avoids sending a test packet arriving at a switch in every direc- tion. This test strategy is referred to as pseudo- exhaustive, versus the exhaustive testing that sends an incoming test packet of a switch in every direction. As compared with the exhaustive strategy, the pseudo- exhaustive testing consumes lower power consumption, has a lower test time and still has 100% switch port fault coverage. This paper discusses our test strategy, test mode switch hardware requirements, and evaluates test power, time, and coverage.

Citation:

Mahshid Sedghi, Elnaz Koopahi, Armin Alaghi, Mahmood Fathy, Zainalabedin Navabi, "An NoC Test Strategy Based on Flooding with Power, Test Time and Coverage Considerations," vlsid, pp.409-414, 21st International Conference on VLSI Design (VLSI Design 2008), 2008

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.