Enhanced Visual Analysis for Cluster Tendency Assessment and Data Partitioning
PrePrint
ISSN: 1041-4347
DOI Bookmark:
http://doi.ieeecomputersociety.org/10.1109/TKDE.2009.192
Visual methods have been widely studied and used in data cluster analysis, \textit{e.g.}, the VAT algorithm for visual analysis of cluster tendency. Given a pairwise dissimilarity matrix $\bm{D}$ of a set of $n$ objects, methods such as VAT generally represent $\bm{D}$ as an $n\times n$ image $\mathrm{I}(\tilde{\bm{D}})$ where the objects are reordered to highlight cluster structure as dark blocks along the diagonal of the image. A major limitation of such visual methods is their inability to highlight cluster structure in $\mathrm{I}(\tilde{\bm{D}})$ when $\bm{D}$ contains clusters with highly complex structure. In this paper, we address this limitation by proposing a Spectral VAT algorithm, where $\bm{D}$ is mapped to $\bm{D'}$ in an embedding space by spectral decomposition of the Laplacian matrix, and then reordered to $\bm{\tilde{D'}}$ using the VAT algorithm. We propose a strategy to automatically determine the number of clusters in $\mathrm{I}(\bm{\tilde{D'}})$, as well as a visual method for cluster formation from $\mathrm{I}(\bm{\tilde{D'}})$ based on the difference between diagonal blocks and off-diagonal blocks. In addition, we propose a sampling-based extended scheme to enable visual cluster tendency assessment and data partitioning for large data sets. Extensive experimental results on several synthetic and real-world data sets demonstrate the effectiveness of our algorithms.
Index Terms:
Clustering, Information visualization, cluster tendency assessment, spectral embedding, pairwise dissimilarity data, Visual partitioning
Citation:
Liang Wang, Xin Geng, James Bezdek, Christopher Leckie, Ramamohanarao Kotagiri, "Enhanced Visual Analysis for Cluster Tendency Assessment and Data Partitioning," IEEE Transactions on Knowledge and Data Engineering, 12 Oct. 2009. IEEE computer Society Digital Library. IEEE Computer Society, <http://doi.ieeecomputersociety.org/10.1109/TKDE.2009.192>
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