loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Probabilistic Topic Models for Learning Terminological Ontologies
PrePrint
ISSN: 1041-4347
Wei Wang, The University of Nottingham Malaysia Campus, Semanyih
Payam Mamaani Barnaghi, The University of Surrey, Selangor Darul Ehsan
Andrzej Bargiela, The University of Nottingham, Nottingham
Probabilistic topic models were originally developed and utilised for document modeling and topic extraction in Information Retrieval. In this paper we describe a new approach for automatic learning of terminological ontologies from text corpus based on such models. In our approach, topic models are used as efficient dimension reduction techniques, which are able to capture semantic relationships between word-topic and topic-document interpreted in terms of probability distributions. We propose two algorithms for learning terminological ontologies using the principle of topic relationship and exploiting information theory with the probabilistic topic models learned. Experiments with different model parameters were conducted and learned ontology statements were evaluated by the domain experts. We have also compared the results of our method with two existing concept hierarchy learning methods on the same dataset. The study shows that our method outperforms other methods in terms of recall and precision measures. The precision level of the learned ontology is sufficient for it to be deployed for the purpose of browsing, navigation, and information search and retrieval in digital libraries.
Index Terms:
Knowledge acquisition, Knowledge Representation Formalisms and Methods, Probability and Statistics
Citation:
Wei Wang, Payam Mamaani Barnaghi, Andrzej Bargiela, "Probabilistic Topic Models for Learning Terminological Ontologies," IEEE Transactions on Knowledge and Data Engineering, 30 Apr. 2009. IEEE computer Society Digital Library. IEEE Computer Society, <http://doi.ieeecomputersociety.org/10.1109/TKDE.2009.122>
Usage of this product signifies your acceptance of the Terms of Use.