An improved Test Control Architecture and Test Control Expansion for Core-Based System Chips

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	Similar Articles Articles by Tom Waayers

International Test Conference 2003 (ITC'03)

Charlotte, NC, USA

September 30-October 02

ISBN: 0-7803-8107-6

	ASCII Text	x
	Tom Waayers, "An improved Test Control Architecture and Test Control Expansion for Core-Based System Chips," Test Conference, International, pp. 1145, International Test Conference 2003 (ITC'03), 2003.

	BibTex	x
	@article{ 10.1109/TEST.2003.1271103, author = {Tom Waayers}, title = {An improved Test Control Architecture and Test Control Expansion for Core-Based System Chips}, journal ={Test Conference, International}, volume = {0}, year = {2003}, issn = {1089-3539}, pages = {1145}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1271103}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - An improved Test Control Architecture and Test Control Expansion for Core-Based System Chips SN - 1089-3539 SP EP A1 - Tom Waayers, PY - 2003 KW - null VL - 0 JA - Test Conference, International ER -

Tom Waayers, Philips Research Laboratories, The Netherlands

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1271103

This paper presents improvement of a core-based chip's test control architecture that uses Std IEEE 1149.1 TAP to access core level register Test Control Blocks (TCB). We show enhancements for the register TCB, to improve its test coverage, to enable IEEE 1149.1 compliant RUNBIST and to optimize chip level TCB access. In addition, Test Control Expansion (TCE) is presented. TCE automatically validates test control architecture in a design netlist, and is capable of calculating chip level test mode initialization sequences.

Citation:

Tom Waayers, "An improved Test Control Architecture and Test Control Expansion for Core-Based System Chips," itc, pp.1145, International Test Conference 2003 (ITC'03), 2003

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