Evolution of IEEE 1149.1 Addressable Shadow Protocol Devices

I
ITC
2003
International Test Conference 2003 (ITC'03)
Abstract - Evolution of IEEE 1149.1 Addressable Shadow Protocol Devices

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International Test Conference 2003 (ITC'03)

Charlotte, NC, USA

September 30-October 02

ISBN: 0-7803-8107-6

	ASCII Text	x
	Rakesh N. Joshi, Kenneth L. Williams, Lee Whetsel, "Evolution of IEEE 1149.1 Addressable Shadow Protocol Devices," Test Conference, International, pp. 981, International Test Conference 2003 (ITC'03), 2003.

	BibTex	x
	@article{ 10.1109/TEST.2003.1271085, author = {Rakesh N. Joshi and Kenneth L. Williams and Lee Whetsel}, title = {Evolution of IEEE 1149.1 Addressable Shadow Protocol Devices}, journal ={Test Conference, International}, volume = {0}, year = {2003}, issn = {1089-3539}, pages = {981}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1271085}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - Evolution of IEEE 1149.1 Addressable Shadow Protocol Devices SN - 1089-3539 SP EP A1 - Rakesh N. Joshi, A1 - Kenneth L. Williams, A1 - Lee Whetsel, PY - 2003 KW - null VL - 0 JA - Test Conference, International ER -

Rakesh N. Joshi, Texas Instruments, Inc. Sherman, Texas

Kenneth L. Williams, Texas Instruments, Inc. Sherman, Texas

Lee Whetsel, Texas Instruments, Inc. Sherman, Texas

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1271085

This paper describes an Addressable Shadow Protocol device that is capable of providing connectivity between a backplane resident IEEE 1149.1 test bus master and a plurality of 1149.1 device chains existing on a board or module. The enhanced device provides for improvement in test, emulation, programming, and other applications based on the 1149.1 test bus.

Citation:

Rakesh N. Joshi, Kenneth L. Williams, Lee Whetsel, "Evolution of IEEE 1149.1 Addressable Shadow Protocol Devices," itc, pp.981, International Test Conference 2003 (ITC'03), 2003

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