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International Test Conference 2003 (ITC'03)
Adapting JTAG for AC Interconnect Testing
Charlotte, NC, USA
September 30-October 02
ISBN: 0-7803-8107-6
ASCII Text
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Lee Whetsel, "Adapting JTAG for AC Interconnect Testing," Test Conference, International, pp. 641, International Test Conference 2003 (ITC'03), 2003.
 
 
BibTex
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@article{ 10.1109/TEST.2003.1270892,
author = {Lee Whetsel},
title = {Adapting JTAG for AC Interconnect Testing},
journal ={Test Conference, International},
volume = {0},
year = {2003},
issn = {1089-3539},
pages = {641},
doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270892},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Test Conference, International
TI - Adapting JTAG for AC Interconnect Testing
SN - 1089-3539
SP
EP
A1 - Lee Whetsel,
PY - 2003
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Lee Whetsel, Texas Instruments
The use of AC coupled interconnects to provide communication paths between devices is increasing. The existing IEEE 1149.1 boundary scan standard [1] (JTAG) has limitations that hinder it from being able to effectively test all AC coupled interconnects. This paper describes a simple enhancement to the JTAG architecture enabling it to operate in new modes facilitating AC interconnect testing.
Citation:
Lee Whetsel, "Adapting JTAG for AC Interconnect Testing," itc, pp.641, International Test Conference 2003 (ITC'03), 2003
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