IEEE 1149.6 - A Practical Perspective

I
ITC
2003
International Test Conference 2003 (ITC'03)
Abstract - IEEE 1149.6 - A Practical Perspective

	This Article
	Subscribers, please Login Purchase article: $19 PDF IEEE Xplore Subscribers RSS feed
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by Bill Eklow Articles by Carl Barnhart Articles by Mike Ricchetti Articles by Terry Borroz

International Test Conference 2003 (ITC'03)

Charlotte, NC, USA

September 30-October 02

ISBN: 0-7803-8107-6

	ASCII Text	x
	Bill Eklow, Carl Barnhart, Mike Ricchetti, Terry Borroz, "IEEE 1149.6 - A Practical Perspective," Test Conference, International, pp. 494, International Test Conference 2003 (ITC'03), 2003.

	BibTex	x
	@article{ 10.1109/TEST.2003.1270875, author = {Bill Eklow and Carl Barnhart and Mike Ricchetti and Terry Borroz}, title = {IEEE 1149.6 - A Practical Perspective}, journal ={Test Conference, International}, volume = {0}, year = {2003}, issn = {1089-3539}, pages = {494}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270875}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - IEEE 1149.6 - A Practical Perspective SN - 1089-3539 SP EP A1 - Bill Eklow, A1 - Carl Barnhart, A1 - Mike Ricchetti, A1 - Terry Borroz, PY - 2003 KW - null VL - 0 JA - Test Conference, International ER -

Bill Eklow, Cisco Systems Inc., San Jose CA

Carl Barnhart, Cadence Design Systems, Ojai, CA

Mike Ricchetti, Intellitech, Durham, NH

Terry Borroz, Teradyne, North Reading, MA

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270875

The IEEE 1149.6 standard was approved in March of 2003. The standard extends the capability of the IEEE 1149.1 standard to include AC-coupled and/or differential nets. These nets are predominant in new, multi-gigabit serial technology.

This paper will present a short overview of the 1149.6 standard and the issues that it addresses. The paper will then discuss design, verification and test considerations that must be dealt with when implementing 1149.6 logic on a component or a board. Since 1149.6 addresses a problem that is in part analog in nature, there are several new issues that must be dealt with which are not covered in previous 1149 based standards. The paper discusses the nature of these issues and their impact on design, verification and test. The paper is intended to be tutorial, providing tips and techniques to allow the user to quickly understand and implement an 1149.6 based design.

Citation:

Bill Eklow, Carl Barnhart, Mike Ricchetti, Terry Borroz, "IEEE 1149.6 - A Practical Perspective," itc, pp.494, International Test Conference 2003 (ITC'03), 2003

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.