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International Test Conference 2003 (ITC'03)
Collection of High-Level Microprocessor Bugs from Formal Verification of Pipelined and Superscalar Designs
Charlotte, NC, USA
September 30-October 02
ISBN: 0-7803-8107-6
ASCII Text
x 
 
Miroslav N. Velev, "Collection of High-Level Microprocessor Bugs from Formal Verification of Pipelined and Superscalar Designs," Test Conference, International, pp. 138, International Test Conference 2003 (ITC'03), 2003.
 
 
BibTex
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@article{ 10.1109/TEST.2003.1270834,
author = {Miroslav N. Velev},
title = {Collection of High-Level Microprocessor Bugs from Formal Verification of Pipelined and Superscalar Designs},
journal ={Test Conference, International},
volume = {0},
year = {2003},
issn = {1089-3539},
pages = {138},
doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270834},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Test Conference, International
TI - Collection of High-Level Microprocessor Bugs from Formal Verification of Pipelined and Superscalar Designs
SN - 1089-3539
SP
EP
A1 - Miroslav N. Velev,
PY - 2003
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Miroslav N. Velev, Georgia Institute of Technology, Atlanta
The paper presents a collection of 93 different bugs, detected in formal verification of 65 student designs that include: 1) single-issue pipelined DLX processors; 2) extensions with exceptions and branch prediction; and 3) dual-issue superscalar implementations. The processors were described in a high-level HDL, and were formally verified with an automatic tool flow. The bugs are analyzed and classified, and can be used in research on micro-processor testing.
Citation:
Miroslav N. Velev, "Collection of High-Level Microprocessor Bugs from Formal Verification of Pipelined and Superscalar Designs," itc, pp.138, International Test Conference 2003 (ITC'03), 2003
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