Efficient Design of System Test: A Layered Architecture

I
ITC
2002
International Test Conference 2002 (ITC'02)
Abstract - Efficient Design of System Test: A Layered Architecture

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International Test Conference 2002 (ITC'02)

Baltimore, MD, USA

October 07-October 10

ISBN: 0-7803-7543-2

	ASCII Text	x
	Andrea Baldini, Alfredo Benso, Paolo Prinetto, Sergio Mo, Andrea Taddei, "Efficient Design of System Test: A Layered Architecture," Test Conference, International, pp. 930, International Test Conference 2002 (ITC'02), 2002.

	BibTex	x
	@article{ 10.1109/TEST.2002.1041848, author = {Andrea Baldini and Alfredo Benso and Paolo Prinetto and Sergio Mo and Andrea Taddei}, title = {Efficient Design of System Test: A Layered Architecture}, journal ={Test Conference, International}, volume = {0}, year = {2002}, isbn = {0-7803-7543-2}, pages = {930}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041848}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - Efficient Design of System Test: A Layered Architecture SN - 0-7803-7543-2 SP EP A1 - Andrea Baldini, A1 - Alfredo Benso, A1 - Paolo Prinetto, A1 - Sergio Mo, A1 - Andrea Taddei, PY - 2002 KW - null VL - 0 JA - Test Conference, International ER -

Andrea Baldini, Politecnico di Torino

Alfredo Benso, Politecnico di Torino

Paolo Prinetto, Politecnico di Torino

Sergio Mo, Magneti Marelli Electronic Systems

Andrea Taddei, Magneti Marelli Electronic Systems

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041848

Starting from the idea of a general methodology to transform design specifications into system level functional test patterns for complex embedded systems, we propose a layered architecture as basis of such process. The architecture aims at strongly simplifying the test design, allowing the test engineer to concentrate on the high level parts of the system and wrapping all the complexity of the test environment.

The results are then verified on a complex case study of automotive applications.

Citation:

Andrea Baldini, Alfredo Benso, Paolo Prinetto, Sergio Mo, Andrea Taddei, "Efficient Design of System Test: A Layered Architecture," itc, pp.930, International Test Conference 2002 (ITC'02), 2002

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