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International Test Conference 2002 (ITC'02)
Automatic Scan Insertion and Test Generation for Asynchronous Circuits
Baltimore, MD, USA
October 07-October 10
ISBN: 0-7803-7543-2
ASCII Text
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Frank te Beest, Ad Peeters, Marc Verra, Kees van Berkel, Hans Kerkhoff, "Automatic Scan Insertion and Test Generation for Asynchronous Circuits," Test Conference, International, pp. 804, International Test Conference 2002 (ITC'02), 2002.
 
 
BibTex
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@article{ 10.1109/TEST.2002.1041834,
author = {Frank te Beest and Ad Peeters and Marc Verra and Kees van Berkel and Hans Kerkhoff},
title = {Automatic Scan Insertion and Test Generation for Asynchronous Circuits},
journal ={Test Conference, International},
volume = {0},
year = {2002},
isbn = {0-7803-7543-2},
pages = {804},
doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041834},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Test Conference, International
TI - Automatic Scan Insertion and Test Generation for Asynchronous Circuits
SN - 0-7803-7543-2
SP
EP
A1 - Frank te Beest,
A1 - Ad Peeters,
A1 - Marc Verra,
A1 - Kees van Berkel,
A1 - Hans Kerkhoff,
PY - 2002
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Frank te Beest, University of Twente
Ad Peeters, Philips Research Laboratories
Marc Verra, Philips Research Laboratories
Kees van Berkel, Philips Research Laboratories and Eindhoven University of Technology
Hans Kerkhoff, University of Twente
A test method for asynchronous handshake circuits presented that is based on synchronous full-scan techniques. The method adds a synchronous test mode to the circuit, in which the entire circuit is controlled by external clocks. This enables the use of conventional test generation tools. The method resulted in an operational flow, capable of automatically testing any handshake circuit with test-quality equal to synchronous circuits. Several circuits have been evaluated, demonstrating over 99% stuck-at fault coverage.
Citation:
Frank te Beest, Ad Peeters, Marc Verra, Kees van Berkel, Hans Kerkhoff, "Automatic Scan Insertion and Test Generation for Asynchronous Circuits," itc, pp.804, International Test Conference 2002 (ITC'02), 2002
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