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International Test Conference 2002 (ITC'02)
System Manufacturing Test Cost Model
Baltimore, MD, USA
October 07-October 10
ISBN: 0-7803-7543-2
ASCII Text
x 
 
David Williams, Anthony P. Ambler, "System Manufacturing Test Cost Model," Test Conference, International, pp. 482, International Test Conference 2002 (ITC'02), 2002.
 
 
BibTex
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@article{ 10.1109/TEST.2002.1041798,
author = {David Williams and Anthony P. Ambler},
title = {System Manufacturing Test Cost Model},
journal ={Test Conference, International},
volume = {0},
year = {2002},
isbn = {0-7803-7543-2},
pages = {482},
doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041798},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Test Conference, International
TI - System Manufacturing Test Cost Model
SN - 0-7803-7543-2
SP
EP
A1 - David Williams,
A1 - Anthony P. Ambler,
PY - 2002
KW - null
VL - 0
JA - Test Conference, International
ER -
 
David Williams, Dell Computer Corporation and University of Texas at Austin
Anthony P. Ambler, University of Texas at Austin
This paper will propose a manufacturing test cost model for systems as they go through a manufacturing test process. The cost model allows the company to calibrate the test process to the risks of the product, while taking into account other manufacturing and development processes. Without an accurate cost model, understanding the financial implication of test tradeoffs is impossible.
Citation:
David Williams, Anthony P. Ambler, "System Manufacturing Test Cost Model," itc, pp.482, International Test Conference 2002 (ITC'02), 2002
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