International Test Conference 2002 (ITC'02) Combining ATPG and Symbolic Simulation for Efficient Validation of Embedded Array Systems Baltimore, MD, USA October 07-October 10 ISBN: 0-7803-7543-2
In the past, Symbolic Trajectory Evaluation (STE) has been shown to be effective for verifying individual array blocks. However, when applying STE to verify multiple array blocks together as a single system, the run-time OBDD sizes would often blow up. In this paper, we propose the use of both ATPG-based justification engine and symbolic simulation to facilitate the application of STE proof methodology for array systems. Our method translates a given verification problem instance into ATPG justification objectives, and partitions a given design into ATPG and symbolic simulation domains. Then, by developing a scheme that enables ATPG justification engine to work closely with the symbolic simulator, the run-time OBDD sizes during each symbolic simulation run can be limited. We demonstrate the effectiveness of our approach by verifying the Memory Management Unit (MMU) in Motorola high-performance microprocessors. The verification of MMU as a whole was not possible before because of the OBDD size blow-up problem when symbolic simulation is used in the STE proof process.
Citation:
Ganapathy Parthasarathy, Madhu K. Iyer, Tao Feng, Li-C. Wang, Kwang-Ting (Tim) Cheng, Magdy S. Abadir, "Combining ATPG and Symbolic Simulation for Efficient Validation of Embedded Array Systems," itc, pp.203, International Test Conference 2002 (ITC'02), 2002 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||