Memory Built-In Self-Repair using redundant words

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	Similar Articles Articles by Volker Schöber Articles by Steffen Paul Articles by Olivier Picot

International Test Conference 2001 (ITC'01)

Baltimore, Maryland

October 30-November 01

ISBN: 0-7803-7171-2

	ASCII Text	x
	Volker Schöber, Steffen Paul, Olivier Picot, "Memory Built-In Self-Repair using redundant words," Test Conference, International, pp. 995, International Test Conference 2001 (ITC'01), 2001.

	BibTex	x
	@article{ 10.1109/TEST.2001.966724, author = {Volker Schöber and Steffen Paul and Olivier Picot}, title = {Memory Built-In Self-Repair using redundant words}, journal ={Test Conference, International}, volume = {0}, year = {2001}, isbn = {0-7803-7171-2}, pages = {995}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2001.966724}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - Memory Built-In Self-Repair using redundant words SN - 0-7803-7171-2 SP EP A1 - Volker Schöber, A1 - Steffen Paul, A1 - Olivier Picot, PY - 2001 KW - BIST KW - Built-In Self-Repair KW - BISR KW - memory test KW - fuse boxes KW - field test VL - 0 JA - Test Conference, International ER -

Volker Schöber, Infineon Technologies AG

Steffen Paul, Infineon Technologies AG

Olivier Picot, Infineon Technologies AG

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2001.966724

A word oriented memory Built-In Self-Repair methodology is described without modifying the memory module. Faulty addresses and its data will be stored in the redundancy logic immediately after its detection during test. Fuse boxes can be connected via scan registers to the redundancy logic.

Index Terms:

BIST, Built-In Self-Repair, BISR, memory test, fuse boxes, field test

Citation:

Volker Schöber, Steffen Paul, Olivier Picot, "Memory Built-In Self-Repair using redundant words," itc, pp.995, International Test Conference 2001 (ITC'01), 2001

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