Prioritized Constraints with Data Sampling Scores for Automatic Test Data Generation

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Eighth ACIS International Conference on Software Engineering, Artificial Intelligence, Networking, and Parallel/Distributed Computing (SNPD 2007)

Haier International Training Center, Qingdao, China

July 30-August 01

ISBN: 0-7695-2909-7

	ASCII Text	x
	Xiao Ma, J. Jenny Li, David M. Weiss, "Prioritized Constraints with Data Sampling Scores for Automatic Test Data Generation," Software Engineering, Artificial Intelligence, Networking, and Parallel/Distributed Computing, ACIS International Conference on, vol. 3, pp. 1129-1134, Eighth ACIS International Conference on Software Engineering, Artificial Intelligence, Networking, and Parallel/Distributed Computing (SNPD 2007), 2007.

	BibTex	x
	@article{ 10.1109/SNPD.2007.523, author = {Xiao Ma and J. Jenny Li and David M. Weiss}, title = {Prioritized Constraints with Data Sampling Scores for Automatic Test Data Generation}, journal ={Software Engineering, Artificial Intelligence, Networking, and Parallel/Distributed Computing, ACIS International Conference on}, volume = {3}, year = {2007}, isbn = {0-7695-2909-7}, pages = {1129-1134}, doi = {http://doi.ieeecomputersociety.org/10.1109/SNPD.2007.523}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Software Engineering, Artificial Intelligence, Networking, and Parallel/Distributed Computing, ACIS International Conference on TI - Prioritized Constraints with Data Sampling Scores for Automatic Test Data Generation SN - 0-7695-2909-7 SP1129 EP1134 A1 - Xiao Ma, A1 - J. Jenny Li, A1 - David M. Weiss, PY - 2007 KW - Test case generation KW - test automation KW - constraint solving KW - software reliability. VL - 3 JA - Software Engineering, Artificial Intelligence, Networking, and Parallel/Distributed Computing, ACIS International Conference on ER -

Xiao Ma, Avaya Labs Research

J. Jenny Li, Avaya Labs Research

David M. Weiss, Avaya Labs Research

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/SNPD.2007.523

Many automatic test data generation approaches use constraint solvers to find data values, e.g. the method given in [1]. One problem with this method is that it cannot generate test data when the constraints are not solvable, either because there is no solution or the constraints are too complex. We propose a constraint prioritization method using data sampling scores to generate valid test data even when a set of constraints is not solvable. Our case study illustrates the effectiveness of this method.

Index Terms:

Test case generation, test automation, constraint solving, software reliability.

Citation:

Xiao Ma, J. Jenny Li, David M. Weiss, "Prioritized Constraints with Data Sampling Scores for Automatic Test Data Generation," snpd, vol. 3, pp.1129-1134, Eighth ACIS International Conference on Software Engineering, Artificial Intelligence, Networking, and Parallel/Distributed Computing (SNPD 2007), 2007

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