loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
IEEE International Conference on Shape Modeling and Applications 2006 (SMI'06)
Fast Sampling of Implicit Surfaces by Particle Systems
Matsushima, Japan
June 14-June 16
ISBN: 0-7695-2591-1
Florian Levet, University Bordeaux 1, France
Xavier Granier, University Bordeaux 1, France
Christophe Schlick, University Bordeaux 1, France
Particle systems, as originally proposed by Witkin and Heckbert [17], are a powerful way to sample implicit surfaces since they generate almost evenly distributed samples over the surface, thanks to a global minimization of an energy criterion. Nonetheless, due to the computational cost of the relaxation process, the sampling process becomes rather expensive when the number of samples exceeds a few thousands.

In this paper, we propose a technique that only relies on a pure geometry processing which enables us to rapidly generate the set of final particles (e.g., half a second to generate 5,000 particles for an analytic implicit surface) with nearoptimal positions. Because of its characteristics, the technique does not need the usual split-and-death criterion anymore and only about ten relaxation steps are necessary to get a high quality sampling. Either uniform or non-uniform sampling can be performed with our technique.

Citation:
Florian Levet, Xavier Granier, Christophe Schlick, "Fast Sampling of Implicit Surfaces by Particle Systems," smi, pp.39, IEEE International Conference on Shape Modeling and Applications 2006 (SMI'06), 2006
Usage of this product signifies your acceptance of the Terms of Use.