30th Annual IEEE/NASA Software Engineering Workshop SEW-30 (SEW'06) Analyzing and Systematizing Current Traceability Schemas Columbia, Maryland April 24-April 28 ISBN: 0-7695-2624-1
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/SEW.2006.12
The aim of this work is to produce a traceability model to enhance processes and tasks, which make extensive use of traceability information such as, V&V, change management and impact analysis, under the Roundtrip Engineering approach. This paper analyzes several current traceability approaches, in order to obtain their relevant features, to identify overlaps and inconsistencies between them, and to select the best traceability practices. It was identified that, several issues still make difficult the adoption of a widescale traceability activity, in the software\system engineering practice, such as, there is a lack of a commonly accepted traceability definition, a standard way of specifying traceability between artifacts, and a traceability type classification. Basing on these findings, an approach for a "Traceability Schema Specification" and a first implementation on a software/system engineering environment are provided. The schema attempts to systematize the definition, deployment and maintenance of a traceability implementation.
Citation:
Angelina Espinoza, Pedro P. Alarcon, Juan Garbajosa, "Analyzing and Systematizing Current Traceability Schemas," sew, pp.21-32, 30th Annual IEEE/NASA Software Engineering Workshop SEW-30 (SEW'06), 2006 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||