29th Annual IEEE/NASA Software Engineering Workshop Towards Software Quality Economics for Defect-Detection Techniques Greenbelt, Maryland April 06-April 07 ISBN: 0-7695-2306-4
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/SEW.2005.47
There are various ways to evaluate defect-detection techniques. However, for a comprehensive evaluation the only possibility is to reduce all influencing factors to costs. There are already some models and metrics for the cost of quality that can be used in that context. The existing metrics for the effectiveness and efficiency of defect-detection techniques and experiences with them are combined with cost metrics to allow a more fine-grained estimation of costs and a comprehensive evaluation of defect-detection techniques. The current model is most suitable for directly comparing concrete applications of different techniques.
Citation:
Stefan Wagner, "Towards Software Quality Economics for Defect-Detection Techniques," sew, pp.265-274, 29th Annual IEEE/NASA Software Engineering Workshop, 2005 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||