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Third ACIS Int'l Conference on Software Engineering Research, Management and Applications (SERA'05)
A Design and Test Technique for Embedded Software
Central Michigan University, Mount Pleasant, Michigan
August 11-August 13
ISBN: 0-7695-2297-1
ASCII Text
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Byeongdo Kang, Young-Jik Kwon, Roger Y. Lee, "A Design and Test Technique for Embedded Software," Software Engineering Research, Management and Applications, ACIS International Conference on, pp. 160-165, Third ACIS Int'l Conference on Software Engineering Research, Management and Applications (SERA'05), 2005.
 
 
BibTex
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@article{ 10.1109/SERA.2005.6,
author = {Byeongdo Kang and Young-Jik Kwon and Roger Y. Lee},
title = {A Design and Test Technique for Embedded Software},
journal ={Software Engineering Research, Management and Applications, ACIS International Conference on},
volume = {0},
year = {2005},
isbn = {0-7695-2297-1},
pages = {160-165},
doi = {http://doi.ieeecomputersociety.org/10.1109/SERA.2005.6},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Software Engineering Research, Management and Applications, ACIS International Conference on
TI - A Design and Test Technique for Embedded Software
SN - 0-7695-2297-1
SP160
EP165
A1 - Byeongdo Kang,
A1 - Young-Jik Kwon,
A1 - Roger Y. Lee,
PY - 2005
KW - Embedded Software
KW - Software Design
KW - Software Test.
VL - 0
JA - Software Engineering Research, Management and Applications, ACIS International Conference on
ER -
 
Byeongdo Kang, Daegu University, South Korea
Young-Jik Kwon, Daegu University, South Korea
Roger Y. Lee, Central Michigan University

In recent years, embedded systems have become so complex and the development time to market is required to be shorter than before. As embedded systems include more functions for new services, embedded software gradually grow in size, and development costs and time are increasing. In order to overcome this serious matter, we need a customized design and test technique for embedded software. In this paper, we present a software architecture style for embedded software. It facilitates the composition of reusable functions and helps developers to reduce development time. Because the costs associated with revealing errors of embedded software in applications are rising, we propose a test method and tools for target environments.

Index Terms:
Embedded Software, Software Design, Software Test.
Citation:
Byeongdo Kang, Young-Jik Kwon, Roger Y. Lee, "A Design and Test Technique for Embedded Software," sera, pp.160-165, Third ACIS Int'l Conference on Software Engineering Research, Management and Applications (SERA'05), 2005
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