2010 8th IEEE International Conference on Software Engineering and Formal Methods Combinatorial Testing for VDM Pisa, Italy September 13-September 18 ISBN: 978-0-7695-4153-2
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/SEFM.2010.32
Combinatorial testing in VDM involves the automatic generation and execution of a large collection of test cases derived from templates provided in the form of trace definitions added to a VDM specification. The main value of this is the rapid detection of run-time errors caused by forgotten preconditions as well as broken invariants and post-conditions. Trace definitions are defined as regular expressions describing possible sequences of operation calls, and are conceptually similar to UML sequence diagrams. In this paper we present a tool enabling test automation based on VDM traces, and explain how it is possible to reduce large collections of test cases in different ways. Its use is illustrated with a small case study.
Index Terms:
VDM, Combinatorial Testing, Shape reduction
Citation:
Peter Gorm Larsen, Kenneth Lausdahl, Nick Battle, "Combinatorial Testing for VDM," sefm, pp.278-285, 2010 8th IEEE International Conference on Software Engineering and Formal Methods, 2010 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||