13th IEEE International Conference on Embedded and Real-Time Computing Systems and Applications (RTCSA 2007) Towards an Automated Test Generation with Delayed Transitions for Timed Systems Daegu, Korea August 21-August 24 ISBN: 0-7695-2975-5
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/RTCSA.2007.71
In this paper we analyze the influence of the urgency in the timed transitions, and as consequence, in the test suite generation. As result, we formalize rules to generate sequences where the messages exchanged may be instantaneous or delayed. In addition, the generated scenarios are able to detect timing faults. For test generation, we use a prototype tool called HJ2IF. It is based on a test purpose algorithm, called Hit-or-Jump and it is applied for systems specified using Intermediate Format language (IF).
Citation:
Elisangela Rodrigues Vieira, Ana Cavalli, "Towards an Automated Test Generation with Delayed Transitions for Timed Systems," rtcsa, pp.226-231, 13th IEEE International Conference on Embedded and Real-Time Computing Systems and Applications (RTCSA 2007), 2007 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||