loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
22nd International Symposium on Reliable Distributed Systems (SRDS'03)
Improving the Multiple Errors Detection Coverage in Distributed Embedded Systems
Florence, Italy
October 06-October 08
ISBN: 0-7695-1955-5
Sara Blanc, Polytechnic University of Valencia
Pedro J. Gil, Polytechnic University of Valencia
Currently, a lot of critical applications in automobile and aircraft avionics are built on fault-tolerant real-time distributed embedded systems. Fault Injection techniques have been used extensively in the experimental validation of these systems and it is a challenge to adapt them to the demands of new technologies. This paper deals with the effect of physical faults at pin level on the Communication Network Interface in a prototype based on Time-Triggered Architecture. Due to the essential necessity of observing system behavior during injection experiments, a suitable monitor for distributed embedded systems is proposed. The monitor is used to detect failures in the value domain that could lead a system to violate its main concern of fail-silence. With the encouragement to improve detection coverage in the value domain, an Error Detection Code is presented, which is useful for dealing with both unidirectional multiple errors as well as random multiple errors. In order to understand how much the code can increase the coverage, it is tested with a realistic brake-by-wire control application.
Citation:
Sara Blanc, Pedro J. Gil, "Improving the Multiple Errors Detection Coverage in Distributed Embedded Systems," srds, pp.303, 22nd International Symposium on Reliable Distributed Systems (SRDS'03), 2003
Usage of this product signifies your acceptance of the Terms of Use.