16th International Conference on Parallel Architecture and Compilation Techniques (PACT 2007) Brasov, Romania September 15-September 19 ISBN: 0-7695-2944-5
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/PACT.2007.59
A major problem facing the computer and semi-conductor industries is the increasing amount of CMOS process variability [1, 3]. Variability in low-level circuit parameters, such as transistor gate length and gate oxide thickness, complicates system design by introducing uncertainty about how a fabricated system will perform. Although a circuit or chip is designed to run at a nominal clock frequency, the fabricated implementation may vary far from this expected performance.
Citation:
Bogdan F. Romanescu, Michael E. Bauer, Daniel J. Sorin, Sule Ozev, "Reducing the Impact of Process Variability with Prefetching and Criticality-Based Resource Allocation," pact, pp.424, 16th International Conference on Parallel Architecture and Compilation Techniques (PACT 2007), 2007 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||