An Intrinsically Robust Technique for Fault Tolerance under Multiple Upsets

I
IOLTS
2004
International On-Line Testing Symposium, 10th IEEE (IOLTS'04)
Abstract - An Intrinsically Robust Technique for Fault Tolerance under Multiple Upsets

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International On-Line Testing Symposium, 10th IEEE (IOLTS'04)

An Intrinsically Robust Technique for Fault Tolerance under Multiple Upsets (PDF)

Funchal, Madeira Island, Portugal

July 12-July 14

ISBN: 0-7695-2180-0

	ASCII Text	x
	C. A. L. Lisb?, L. Carro, "An Intrinsically Robust Technique for Fault Tolerance under Multiple Upsets," On-Line Testing Symposium, IEEE International, pp. 180, International On-Line Testing Symposium, 10th IEEE (IOLTS'04), 2004.

	BibTex	x
	@article{ 10.1109/OLT.2004.1319682, author = {C. A. L. Lisb? and L. Carro}, title = {An Intrinsically Robust Technique for Fault Tolerance under Multiple Upsets}, journal ={On-Line Testing Symposium, IEEE International}, volume = {0}, year = {2004}, isbn = {0-7695-2180-0}, pages = {180}, doi = {http://doi.ieeecomputersociety.org/10.1109/OLT.2004.1319682}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - On-Line Testing Symposium, IEEE International TI - An Intrinsically Robust Technique for Fault Tolerance under Multiple Upsets SN - 0-7695-2180-0 SP EP A1 - C. A. L. Lisb?, A1 - L. Carro, PY - 2004 KW - null VL - 0 JA - On-Line Testing Symposium, IEEE International ER -

C. A. L. Lisb?, Instituto de Inform?tica and Departamento de Engenharia El?trica - UFRGS

L. Carro, Instituto de Inform?tica and Departamento de Engenharia El?trica - UFRGS

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/OLT.2004.1319682

In this study, the use of stochastic operators for the design of inherently robust circuits for future technologies is proposed, being an alternative to conventional digital arithmetic operators.

Citation:

C. A. L. Lisb?, L. Carro, "An Intrinsically Robust Technique for Fault Tolerance under Multiple Upsets," iolts, pp.180, International On-Line Testing Symposium, 10th IEEE (IOLTS'04), 2004

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