loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
9th IEEE International On-Line Testing Symposium
Perspectives of Combining on-line and off-line Test Technology for Dependable Systems on a Chip
Kos Island, Greece
July 07-July 09
ISBN: 0-7695-1968-7
ASCII Text
x 
 
Christian Galke, Marcus Grabow, Heinrich Theodor Vierhaus, "Perspectives of Combining on-line and off-line Test Technology for Dependable Systems on a Chip," On-Line Testing Symposium, IEEE International, pp. 183, 9th IEEE International On-Line Testing Symposium, 2003.
 
 
BibTex
x
 
@article{ 10.1109/OLT.2003.1214396,
author = {Christian Galke and Marcus Grabow and Heinrich Theodor Vierhaus},
title = {Perspectives of Combining on-line and off-line Test Technology for Dependable Systems on a Chip},
journal ={On-Line Testing Symposium, IEEE International},
volume = {0},
year = {2003},
isbn = {0-7695-1968-7},
pages = {183},
doi = {http://doi.ieeecomputersociety.org/10.1109/OLT.2003.1214396},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - On-Line Testing Symposium, IEEE International
TI - Perspectives of Combining on-line and off-line Test Technology for Dependable Systems on a Chip
SN - 0-7695-1968-7
SP
EP
A1 - Christian Galke,
A1 - Marcus Grabow,
A1 - Heinrich Theodor Vierhaus,
PY - 2003
KW - null
VL - 0
JA - On-Line Testing Symposium, IEEE International
ER -
 
Christian Galke, Brandenburg University of Technology Cottbus
Marcus Grabow, Brandenburg University of Technology Cottbus
Heinrich Theodor Vierhaus, Brandenburg University of Technology Cottbus
Silicon IC technology is entering a new stage of development with the arrival of structures below 100 nm. Such devices are volatile to external radiation effects caused by radioactive particles. Hence circuits in safety critical applications must be self-testing and self-correcting. Production test for complex ICs in deep sub-micron technology is also becoming impossible without built-in self test technology. In this paper, we try to analyze in how far self-test technology for production test and for on-line self test can be combined for reducing the overall overhead for testing.
Citation:
Christian Galke, Marcus Grabow, Heinrich Theodor Vierhaus, "Perspectives of Combining on-line and off-line Test Technology for Dependable Systems on a Chip," iolts, pp.183, 9th IEEE International On-Line Testing Symposium, 2003
Usage of this product signifies your acceptance of the Terms of Use.