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9th IEEE International On-Line Testing Symposium
Memory Built-In Self-Repair for Nanotechnologies
Kos Island, Greece
July 07-July 09
ISBN: 0-7695-1968-7
ASCII Text
x 
 
M. Nicolaidis, N. Achouri, L. Anghel, "Memory Built-In Self-Repair for Nanotechnologies," On-Line Testing Symposium, IEEE International, pp. 94, 9th IEEE International On-Line Testing Symposium, 2003.
 
 
BibTex
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@article{ 10.1109/OLT.2003.1214373,
author = {M. Nicolaidis and N. Achouri and L. Anghel},
title = {Memory Built-In Self-Repair for Nanotechnologies},
journal ={On-Line Testing Symposium, IEEE International},
volume = {0},
year = {2003},
isbn = {0-7695-1968-7},
pages = {94},
doi = {http://doi.ieeecomputersociety.org/10.1109/OLT.2003.1214373},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - On-Line Testing Symposium, IEEE International
TI - Memory Built-In Self-Repair for Nanotechnologies
SN - 0-7695-1968-7
SP
EP
A1 - M. Nicolaidis,
A1 - N. Achouri,
A1 - L. Anghel,
PY - 2003
KW - null
VL - 0
JA - On-Line Testing Symposium, IEEE International
ER -
 
M. Nicolaidis, iRoC Technologies
N. Achouri, iRoC Technologies
L. Anghel, TIMA laboratory
This paper presents memory Built-In Self-Repair approaches allowing to achieve high yield for defect densities several orders of magnitude higher than in current technologies. Such repair schemes illustrate that we could built memories in nanoelectronic technologies that are subject to very high defect densities.
Citation:
M. Nicolaidis, N. Achouri, L. Anghel, "Memory Built-In Self-Repair for Nanotechnologies," iolts, pp.94, 9th IEEE International On-Line Testing Symposium, 2003
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