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Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02)
Isle of Bendor, France
July 08-July 10
ISBN: 0-7695-1641-6
ASCII Text
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Luis Berrojo, Isabel González, Luis Entrena, Celia López, Fulvio Corno, Matteo Sonza, Giovanni Squillero, "Analysis of the Equivalences and Dominances of Transient Faults at the RT Level," On-Line Testing Workshop, IEEE International, pp. 193, Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02), 2002.
 
 
BibTex
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@article{ 10.1109/OLT.2002.1030216,
author = {Luis Berrojo and Isabel González and Luis Entrena and Celia López and Fulvio Corno and Matteo Sonza and Giovanni Squillero},
title = {Analysis of the Equivalences and Dominances of Transient Faults at the RT Level},
journal ={On-Line Testing Workshop, IEEE International},
volume = {0},
year = {2002},
isbn = {0-7695-1641-6},
pages = {193},
doi = {http://doi.ieeecomputersociety.org/10.1109/OLT.2002.1030216},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - On-Line Testing Workshop, IEEE International
TI - Analysis of the Equivalences and Dominances of Transient Faults at the RT Level
SN - 0-7695-1641-6
SP
EP
A1 - Luis Berrojo,
A1 - Isabel González,
A1 - Luis Entrena,
A1 - Celia López,
A1 - Fulvio Corno,
A1 - Matteo Sonza,
A1 - Giovanni Squillero,
PY - 2002
KW - null
VL - 0
JA - On-Line Testing Workshop, IEEE International
ER -
 
Luis Berrojo, Alcatel Espacio
Isabel González, Alcatel Espacio
Luis Entrena, Universidad Carlos III de Madrid
Celia López, Universidad Carlos III de Madrid
Fulvio Corno, Polit?cnico di Torino
Matteo Sonza, Polit?cnico di Torino
Giovanni Squillero, Polit?cnico di Torino
This work presents a study for tackling transient faults at the RT-level and outlines the techniques devised and implemented to speed-up fault-injection campaigns, detecting the equivalences and dominancies between faults in order to collapse them. Experimental results are provided on an industrial case study, demonstrating the effectiveness of the approach.
Citation:
Luis Berrojo, Isabel González, Luis Entrena, Celia López, Fulvio Corno, Matteo Sonza, Giovanni Squillero, "Analysis of the Equivalences and Dominances of Transient Faults at the RT Level," ioltw, pp.193, Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02), 2002
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