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Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02)
Isle of Bendor, France
July 08-July 10
ISBN: 0-7695-1641-6
ASCII Text
x 
 
Adam Kristof, "On-Line Detection of Short Circuits in Digital Devices and Systems," On-Line Testing Workshop, IEEE International, pp. 183, Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02), 2002.
 
 
BibTex
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@article{ 10.1109/OLT.2002.1030207,
author = {Adam Kristof},
title = {On-Line Detection of Short Circuits in Digital Devices and Systems},
journal ={On-Line Testing Workshop, IEEE International},
volume = {0},
year = {2002},
isbn = {0-7695-1641-6},
pages = {183},
doi = {http://doi.ieeecomputersociety.org/10.1109/OLT.2002.1030207},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - On-Line Testing Workshop, IEEE International
TI - On-Line Detection of Short Circuits in Digital Devices and Systems
SN - 0-7695-1641-6
SP
EP
A1 - Adam Kristof,
PY - 2002
KW - null
VL - 0
JA - On-Line Testing Workshop, IEEE International
ER -
 
Adam Kristof, Silesian University of Technology in Gliwice
Presented method of on-line detection of overloads and short circuits in digital devices and systems is based on inexpensive overload detectors built into integrated circuits. A prototype 0.8 ?m CMOS ASIC successfully verifies this method.
Citation:
Adam Kristof, "On-Line Detection of Short Circuits in Digital Devices and Systems," ioltw, pp.183, Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02), 2002
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